Product Brands
Automatic Optical Inspection (AOI)
Precision Machining in Semiconductor Advanced Packaging
Leader in Thermal and UV Light Process Equipment since 1966
High Resolution 3D Surface Non-Contact Measurement Systems
Laser Range Finder
Auto and Accurate Bond Tester
Microscopy Solution - More than Microscopy
High End 3D CT X-Ray
Wafer Inspection Systems
Reflow Simulator for Observation and Measurement
Scanning Acoustic Microscopy Analytical Systems
Nikon XTV160 Xray
Reliable High Speed Test Handlers since 2011
Microwave Plasma Decapsulation System
eviXscan 3D is a brand of high quality scanners based on structured light technology
Electron Microscope Supplies
Full solution of Metallography, Metallurgical Testing, Microstructural Analysis
Leader in Wafer AOI and Precision Grinding in Semiconductor Advanced Packaging
- Brand
- Symphony AOI
HW Wafer AOI 5510
Applied to shipment after wafer cutting/post-seal cutting, it detects um-level defects on 6-12 inch wafers, provides yield feedback and outputs map to optimize efficiency
- Brand
- Pace Technologies
Wafering Saws
Metallographic diamond wafering saws ranging from low/medium speed precision cutters (PICO-155 / PICO-155P) to high speed automatic diamond wafer cutters (PICO-175). These diamond and small abrasive saws have low and high speed cutting capabilities for a wide range of materials from ceramics and glass to sensitive electronics components. Wafering blade cutting consumables
- Brand
- PVA TePla SPA
EBIS Wafer Backside Optical Inspection
Semi-automatic Wafer Backside Inspection System
- Brand
- PVA TePla SPA
Semi Automatic Wafer Inspection
Wafer Inspection System with Wafer Loader and Wafer Mapping Software