High Resolution 3D Surface Non-Contact Measurement Systems
Leader in Thermal and UV Light Process Equipment since 1966
Precision Machining in Semiconductor Advanced Packaging
Leader in Wafer AOI and Precision Grinding in Semiconductor Advanced Packaging
Scanning Acoustic Microscopy Analytical Systems
Reflow Simulator for Observation and Measurement
Wafer Inspection Systems
High End 3D CT X-Ray
Microscopy Solution - More than Microscopy
Auto and Accurate Bond Tester
Full solution of Metallography, Metallurgical Testing, Microstructural Analysis
Electron Microscope Supplies
eviXscan 3D is a brand of high quality scanners based on structured light technology
Microwave Plasma Decapsulation System
Nikon XTV160 Xray
Reliable High Speed Test Handlers since 2011
Wafer Inspection System with Wafer Loader and Wafer Mapping Software
AOI of Wafer Surfaces and Layers in 2D with IR Technology
Semi-automatic Wafer Backside Inspection System
A multi functional compact docking unit for existing probers