High Resolution 3D Surface Non-Contact Measurement Systems
Laser Range Finder
Leader in Wafer AOI and Precision Grinding in Semiconductor Advanced Packaging
Precision Machining in Semiconductor Advanced Packaging
Leader in Thermal and UV Light Process Equipment since 1966
Wafer Inspection Systems
High End 3D CT X-Ray
Microscopy Solution - More than Microscopy
Reflow Simulator for Observation and Measurement
Auto and Accurate Bond Tester
Scanning Acoustic Microscopy Analytical Systems
eviXscan 3D is a brand of high quality scanners based on structured light technology
Microwave Plasma Decapsulation System
Nikon XTV160 Xray
Reliable High Speed Test Handlers since 2011
Electron Microscope Supplies
Full solution of Metallography, Metallurgical Testing, Microstructural Analysis
Compact, high resolution non-contact profilometer up to 150 x 150mm scanning area
The CT 350S is a non-contact profilometer with a 350 mm x-, y-scanning stage
The CT 600S is a non-contact profilometer with a 600 mm x-, y-motion system