The cyberSCAN VANTAGE 2 is a non-contact surface metrology system. It combines high resolution confocal sensor technology with a x- and y-translation stage. The system can measure large areas up to 200 mm with maximum x-, y-, z-resolution. All electronic components are integrated into a robust housing, no cables or external controllers are required. The system is connected with a single USB cable to PC or workstation. The proprietary and user friendly cyberTECHNOLOGIES Software offers sophisticated surface metrology analyses and automated measurement routines.